Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits
نویسندگان
چکیده
ÐIn 1972, Reddy showed that the binary circuits realizing Reed-Muller canonical form are easily testable. In this paper, we extend Reddy's result to multiple-valued logic circuits, employing more than two discrete levels of signal. The electronic fabrication of such circuits became feasible due to the recent advances in integrated circuit technology. We show that, in the multiple-valued case, several new phenomena occur which allow us to asymptotically reduce the upper bound on the number of tests required for fault detection, but make the generation of tests harder.
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عنوان ژورنال:
- IEEE Trans. Computers
دوره 49 شماره
صفحات -
تاریخ انتشار 2000